80 search results - page 2 / 16 » Compressing Functional Tests for Microprocessors |
VLSID
2000
IEEE
13 years 9 months ago
2000
IEEE
We address the problem of verifying the correctness of pre-silicon models of a microprocessor. We touch on the latest advances in this area by considering two different aspects of...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructions. It is observed that a structurally testable path (i.e., a path testable thro...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Functional, instruction-based self-testing of microprocessors has recently emerged as an effective alternative or supplement to other testing approaches, and is progressively adop...