VTS   2000 IEEE VLSI Test Symposium
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Path Selection for Delay Testing of Deep Sub-Micron Devices Using Statistical Performance Sensitivity Analysis
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
Jing-Jia Liou, Kwang-Ting Cheng, Deb Aditya Mukher...
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