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VTS   2000 IEEE VLSI Test Symposium
Wall of Fame | Most Viewed VTS-2000 Paper
VTS
2000
IEEE
167views Hardware» more  VTS 2000»
8 years 11 months ago
Path Selection for Delay Testing of Deep Sub-Micron Devices Using Statistical Performance Sensitivity Analysis
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
Jing-Jia Liou, Kwang-Ting Cheng, Deb Aditya Mukher...
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