20 search results - page 2 / 4 » Correct Passive Testing Algorithms and Complete Fault Covera... |
DATE
1998
IEEE
13 years 10 months ago
1998
IEEE
Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e....
VTS
2006
IEEE
13 years 11 months ago
2006
IEEE
A new algorithm for identifying stuck faults in combinational circuits that cannot be detected by a given input sequence is presented. Other than pre and post-processing steps, ce...
KBSE
2005
IEEE
13 years 11 months ago
2005
IEEE
The term grammar-based software describes software whose input can be specified by a context-free grammar. This grammar may occur explicitly in the software, in the form of an in...
TC
1998
13 years 5 months ago
1998
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
RTS
2006
13 years 5 months ago
2006
Abstract. The Time-Triggered Architecture, as architecture for safety-critical realtime applications, incorporates fault-tolerance mechanisms to ensure correct system operation des...