: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
Recent studies have suggested that the soft-error rate in microprocessor logic will become a reliability concern by 2010. This paper proposes an efficient error detection techniqu...
Jared C. Smolens, Brian T. Gold, Jangwoo Kim, Baba...
Device scaling in new and future technologies brings along severe increase in the soft error rate of circuits, for combinational and sequential logic. Although potential solutions...