Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
Jason A. Blome, Shantanu Gupta, Shuguang Feng, Sco...
Device scaling and large scale integration have led to growing concerns about soft errors in microprocessors. To date, in all but the most demanding applications, implementing par...
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
Continuous technology scaling has brought us to a point, where transistors have become extremely susceptible to cosmic radiation strikes, or soft errors. Inside the processor, cac...
— Device scaling and large integration increase the vulnerability of microprocessors to transient errors. One of the structures where errors can be most harmful is the register ï...