1944 search results - page 2 / 389 » Coupling-based Integration Testing |
INTEGRATION
1998
13 years 4 months ago
1998
ATS
2010
IEEE
13 years 1 months ago
2010
IEEE
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
AMOST
2007
ACM
13 years 9 months ago
2007
ACM
When integrating dierent system components, the interaction between dierent features is often error prone. Typically errors occur on interruption, concurrency or disabling/ enabli...
ENTCS
2010
13 years 5 months ago
2010
During the verification phase in component-oriented approaches to (embedded) system development component tests are generally followed by system tests, often using different testi...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...