Sciweavers

Share
ATS   2010 Asian Test Symposium
Wall of Fame | Most Viewed ATS-2010 Paper
ATS
2010
IEEE
261views Hardware» more  ATS 2010»
7 years 10 months ago
The Test Ability of an Adaptive Pulse Wave for ADC Testing
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
Xiaoqin Sheng, Hans G. Kerkhoff
Disclaimer and Copyright Notice
Sciweavers respects the rights of all copyright holders and in this regard, authors are only allowed to share a link to their preprint paper on their own website. Every contribution is associated with a desciptive image. It is the sole responsibility of the authors to ensure that their posted image is not copyright infringing. This service is compliant with IEEE copyright.
IdReadViewsTitleStatus
1Download preprint from source261
2Download preprint from source253
3Download preprint from source250
4Download preprint from source239
5Download preprint from source239
6Download preprint from source229
books