1944 search results - page 388 / 389 » Coupling-based Integration Testing |
DAC
2011
ACM
12 years 5 months ago
2011
ACM
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
CHI
2004
ACM
14 years 5 months ago
2004
ACM
1 Electronic mail has become the most widely used business productivity application. However, people increasingly feel frustrated by their email. They are overwhelmed by the volum...
TFM
2009
Springer
13 years 12 months ago
2009
Springer
action and Modelling - a complementary partnership” 10h30 – 11h 00 Coffee break 11h-12h30 Session 1 “Model Transformation: Foundations” Algebraic models for bidirectional m...
FMICS
2009
Springer
13 years 12 months ago
2009
Springer
on Abstraction: a Lightweight Approach to Modelling Concurrency. Javier de Dios and Ricardo Peña Certified Implementation on top of the Java Virtual Machine 19:00 Social dinner + ...
ISCA
2010
IEEE
13 years 9 months ago
2010
IEEE
Technology advancements have enabled the integration of large on-die embedded DRAM (eDRAM) caches. eDRAM is significantly denser than traditional SRAMs, but must be periodically r...