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ICCD
2004
IEEE
122views Hardware» more  ICCD 2004»
14 years 2 months ago
Quality Improvement Methods for System-Level Stimuli Generation
Functional verification of systems is aimed at validating the integration of previously verified components. It deals with complex designs, and invariably suffers from scarce re...
Roy Emek, Itai Jaeger, Yoav Katz, Yehuda Naveh
DATE
2007
IEEE
155views Hardware» more  DATE 2007»
13 years 11 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
GLVLSI
2008
IEEE
157views VLSI» more  GLVLSI 2008»
13 years 11 months ago
Coverage-driven automatic test generation for uml activity diagrams
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
Mingsong Chen, Prabhat Mishra, Dhrubajyoti Kalita
ICSEA
2007
IEEE
13 years 11 months ago
Test-Case Generation and Coverage Analysis for Nondeterministic Systems Using Model-Checkers
Abstract—Nondeterminism is used as a means of underspecification or implementation choice in specifications, and it is often necessary if part of a system or the environment is...
Gordon Fraser, Franz Wotawa