50 search results - page 3 / 10 » Coverage directed test generation for functional verificatio... |
VLSID
2010
IEEE
13 years 3 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
SAFECOMP
2005
Springer
13 years 11 months ago
2005
Springer
As programmable logic controllers(PLCs) have been used in safety-critical applications, testing of PLC applications has become important. The previous PLC-based software testing te...
ICCAD
1999
IEEE
13 years 9 months ago
1999
IEEE
State space techniques have proven to be useful for measuring and improving the coverage of test vectors that are used during functional validation via simulation. By comparing th...
VLSID
2000
IEEE
13 years 9 months ago
2000
IEEE
We address the problem of verifying the correctness of pre-silicon models of a microprocessor. We touch on the latest advances in this area by considering two different aspects of...
EMSOFT
2008
Springer
13 years 7 months ago
2008
Springer
The Simulink/Stateflow (SL/SF) environment from Mathworks is becoming the de facto standard in industry for model based development of embedded control systems. Many commercial to...