2 search results - page 1 / 1 » Current Testable Design of Resistor String DACs |
DELTA
2006
IEEE
13 years 10 months ago
2006
IEEE
In this paper, supply current testability is examined experimentally for opens and shorts in a general 3 bit resistor string Digital/Analog converter(DAC). The results show that a...
DAC
2012
ACM
11 years 7 months ago
2012
ACM
Due to the large geometry of through-silicon-vias (TSVs) and their connections to the power grid, significant current crowding can occur in 3D ICs. Prior works model TSVs and pow...