6 search results - page 1 / 2 » Current ratios: a self-scaling technique for production IDDQ... |
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describ...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
DAC
1999
ACM
13 years 9 months ago
1999
ACM
Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...
IC
2004
13 years 6 months ago
2004
The existing TCP (Transmission Control Protocol) is known to be unsuitable for a network with the characteristics of high BDP (Bandwidth-Delay Product) because of the fixed small o...