87 search results - page 18 / 18 » Curves That Must Be Retraced |
CORR
2007
Springer
13 years 5 months ago
2007
Springer
— This paper addresses the following question, which is of interest in the design and deployment of a multiuser decentralized network. Given a total system bandwidth of W Hz and ...
TCAD
2008
13 years 5 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...