3 search results - page 1 / 1 » Data Retention Fault in SRAM Memories: Analysis and Detectio... |
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
VLSID
2004
IEEE
14 years 5 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...