5 search results - page 1 / 1 » Dealing with Transient Faults in the Interconnection Network... |
TPDS
2010
12 years 11 months ago
2010
The importance of transient faults is predicted to grow due to current technology trends of increased scale of integration. One of the components that will be significantly affecte...
DSN
2008
IEEE
13 years 11 months ago
2008
IEEE
Current technology trends of increased scale of integration are pushing CMOS technology into the deepsubmicron domain, enabling the creation of chips with a significantly greater...
TPDS
2008
13 years 4 months ago
2008
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On th...
HPCA
2007
IEEE
14 years 5 months ago
2007
IEEE
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On t...
ISCA
2002
IEEE
13 years 9 months ago
2002
IEEE
We develop an availability solution, called SafetyNet, that uses a unified, lightweight checkpoint/recovery mechanism to support multiple long-latency fault detection schemes. At...