67 search results - page 1 / 14 » Defect Aware Test Patterns |
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The propose...
DATE
2010
IEEE
13 years 7 months ago
2010
IEEE
Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
N-detect test has been shown to have a higher likelihood for detecting defects. However, traditional definitions of Ndetect test do not necessarily exploit the localized characte...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
The impact of test conditions on the detectability of open defects is investigated. We performed an inductive fault analysis on representative standard gates. The simulation resul...