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» Defect Characterization for Scaling of QCA Devices
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DFT
2004
IEEE
118views VLSI» more  DFT 2004»
13 years 8 months ago
Defect Characterization for Scaling of QCA Devices
Quantum dot Cellular Automata (QCA) is amongst promising new computing scheme in the nano-scale regimes. As an emerging technology, QCA relies on radically different operations in...
Jing Huang, Mariam Momenzadeh, Mehdi Baradaran Tah...
DATE
2006
IEEE
136views Hardware» more  DATE 2006»
13 years 10 months ago
Defect tolerance of QCA tiles
Quantum dot Cellular Automata (QCA) is one of the promising technologies for nano scale implementation. The operation of QCA systems is based on a new paradigm generally referred ...
Jing Huang, Mariam Momenzadeh, Fabrizio Lombardi