48 search results - page 2 / 10 » Defect tolerance for nanocomputer architecture |
ISVLSI
2006
IEEE
13 years 11 months ago
2006
IEEE
With advances in process technology, the feature sizes are decreasing, which leads to higher defect densities. More sophisticated techniques, at increased costs are required to av...
PRDC
2006
IEEE
13 years 11 months ago
2006
IEEE
As SRAM devices are scaled down, the number of variation-induced defective memory cells increases rapidly. Combination of ECC, particularly SECDED, with a redundancy technique can...
VLSID
2004
IEEE
14 years 6 months ago
2004
IEEE
As we move from deep submicron technology to nanotechnology for device manufacture, the need for defect-tolerant architectures is gaining importance. This is because, at the nanos...
ASPLOS
2006
ACM
13 years 11 months ago
2006
ACM
JETC
2007
13 years 5 months ago
2007