32 search results - page 1 / 7 » Deformations of IC Structure in Test and Yield Learning |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper argues that the existing approaches to modeling and characterization of IC malfunctions are inadequate for test and yield learning of Deep Sub-Micron (DSM) products. Tr...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
ICCV
2001
IEEE
14 years 6 months ago
2001
IEEE
In this paper we present a new method for estimating confidence and curvature of 3-D curvilinear structures. The gradient structure tensor (GST) models shift-invariance. The eigen...
SDM
2008
SIAM
13 years 6 months ago
2008
SIAM
In this paper we present the Dynamic Grow-Shrink Inference-based Markov network learning algorithm (abbreviated DGSIMN), which improves on GSIMN, the state-ofthe-art algorithm for...
CVPR
2009
IEEE
15 years 5 days ago
2009
IEEE
Multi-modal image registration is a challenging problem in medical imaging. The goal is to align anatomically identical structures; however, their appearance in images acquired wit...