2 search results - page 1 / 1 » Dependability Analysis of Nano-scale FinFET circuits |
ISVLSI
2006
IEEE
13 years 11 months ago
2006
IEEE
FinFET technology has been proposed as a promising alternative for deep sub-micro bulk CMOS technology, because of its better scalability. Previous work have studied the performan...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
In nanometer scaled CMOS devices significant increase in the subthreshold, the gate and the reverse biased junction band-toband-tunneling (BTBT) leakage, results in the large incr...