135 search results - page 1 / 27 » Design challenges at 65nm and beyond |
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
DAC
2005
ACM
13 years 7 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
NOCS
2007
IEEE
13 years 11 months ago
2007
IEEE
As embedded computing evolves towards ever more powerful architectures, the challenge of properly interconnecting large numbers of on-chip computation blocks is becoming prominent...
ICCD
2007
IEEE
14 years 1 months ago
2007
IEEE
As chip multiprocessors (CMPs) become the only viable way to scale up and utilize the abundant transistors made available in current microprocessors, the design of on-chip network...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
The old school of analog designers, exemplified by pioneer Bob Pease, is becoming an extinct species. But the demand for analog/mixed-signal IP blocks has never been greater, espe...