49 search results - page 8 / 10 » Design fault directed test generation for microprocessor val... |
ICCD
2006
IEEE
14 years 3 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
IJES
2006
13 years 6 months ago
2006
This paper describes novel methods of exploiting the partial, dynamic reconfiguration capabilities of Xilinx Virtex V1000 FPGAs to manage single-event upset (SEU) faults due to rad...
ISSTA
2012
ACM
11 years 8 months ago
2012
ACM
We introduce the concept of “residual investigation” for program analysis. A residual investigation is a dynamic check installed as a result of running a static analysis that ...
VLSID
2006
IEEE
14 years 8 days ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
TOOLS
2000
IEEE
13 years 10 months ago
2000
IEEE
This paper presents a method and a tool for building trustable OO components. The methodology is based on an integrated design and test approach for OO software components. It is ...