85 search results - page 17 / 17 » Designing Memory Subsystems Resilient to Process Variations |
TCAD
2008
13 years 4 months ago
2008
Abstract--Thermal issues are fast becoming major design constraints in high-performance systems. Temperature variations adversely affect system reliability and prompt worst-case de...
ISCA
2010
IEEE
13 years 9 months ago
2010
IEEE
As technology scales ever further, device unreliability is creating excessive complexity for hardware to maintain the illusion of perfect operation. In this paper, we consider whe...
EMSOFT
2008
Springer
13 years 5 months ago
2008
Springer
Dynamic Voltage Scaling (DVS) and Dynamic Power Management (DPM) are two popular techniques commonly employed to save energy in real-time embedded systems. DVS policies aim at red...
ISCI
2007
13 years 4 months ago
2007
Efficient processing of distance-based queries (DBQs) is of great importance in spatial databases due to the wide area of applications that may address such queries. The most repr...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
: Double-Gate (DG) transistors have emerged as promising devices for nano-scale circuits due to their better scalability compared to bulk CMOS. Among the various types of DG device...