15 search results - page 2 / 3 » Detecting Defects in Object-Oriented Designs: Using Reading ... |
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Embedded First-In First-Out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clock...
SEKE
2001
Springer
13 years 9 months ago
2001
Springer
ct 7 Applying finite-state verification techniques to software systems looks attractive because they are capable of detecting very subtle 8 defects in the logic design of these s...
ISSRE
2003
IEEE
13 years 10 months ago
2003
IEEE
Software development project employs some Quality Control (QC) process to detect and remove defects. The final quality of the delivered software depends on the effort spent on al...
ISESE
2006
IEEE
13 years 11 months ago
2006
IEEE
Inspection is considered a powerful method to check software documents for defects. Many published work shows that inspections in requirements specification phase are particularly...
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...