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» Deterministic Logic BIST for Transition Fault Testing
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PTS
2007
102views Hardware» more  PTS 2007»
13 years 7 months ago
Testing and Model-Checking Techniques for Diagnosis
Black-box testing is a popular technique for assessing the quality of a system. However, in case of a test failure, only little information is available to identify the root-cause ...
Maxim Gromov, Tim A. C. Willemse
DFT
1999
IEEE
114views VLSI» more  DFT 1999»
13 years 10 months ago
Yield Enhancement Considerations for a Single-Chip Multiprocessor System with Embedded DRAM
A programmable single-chip multiprocessor system for video coding has been developed. The system is implemented in a high-performance 0.25 m logic/embedded DRAM process. It integr...
Markus Rudack, Dirk Niggemeyer
ENTCS
1998
115views more  ENTCS 1998»
13 years 5 months ago
A Testing Equivalence for Reactive Probabilistic Processes
We consider a generalisation of Larsen and Skou’s [19] reactive probabilistic transition systems which exhibit three kinds of choice: action-guarded probabilistic choice, extern...
Marta Z. Kwiatkowska, Gethin Norman
ITC
1997
IEEE
80views Hardware» more  ITC 1997»
13 years 10 months ago
Scan Synthesis for One-Hot Signals
Tri-state buses and pass transistor logic are used in many complex applications to achieve high performance and small area. Such circuits often contain logic requiring one-hot sig...
Subhasish Mitra, LaNae J. Avra, Edward J. McCluske...
DAC
2006
ACM
13 years 7 months ago
Systematic software-based self-test for pipelined processors
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
Mihalis Psarakis, Dimitris Gizopoulos, Miltiadis H...