73 search results - page 15 / 15 » Deterministic Logic BIST for Transition Fault Testing |
IFIP
2001
Springer
13 years 9 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
ASPDAC
2006
ACM
13 years 11 months ago
2006
ACM
This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A nonrobust delay test is used while each test vector is compacted to...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
As integrated circuit technology plumbs ever greater depths in the scaling of feature sizes, maintaining the paradigm of deterministic Boolean computation is increasingly challeng...