This paper addresses the problem of locating the stuckopen faults in a manufactured IC with scan flip-flops. Unlike most previous methods that only aim at identifying the faulty s...
Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we particularly address the problem of diagnosing faults that exhibit the so-called Byzantine...
Davies and Wakerly show that Byzantine fault tolerance can be achieved by a cascade of broadcasts and middle value select functions. We present an extension of the Davies and Waker...
Paul S. Miner, Alfons Geser, Lee Pike, Jeffrey Mad...
Designing a distributed fault tolerance algorithm requires careful analysis of both fault models and diagnosis strategies. A system will fail if there are too many active faults, ...