7 search results - page 1 / 2 » Diagnostic Testing of Embedded Memories Based on Output Trac... |
MTDT
2000
IEEE
13 years 9 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
CSREAESA
2009
13 years 6 months ago
2009
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...
CASES
2004
ACM
13 years 10 months ago
2004
ACM
ScratchPad Memories (SPMs) are commonly used in embedded systems because they are more energy-efficient than caches and enable tighter application control on the memory hierarchy...
TIME
2005
IEEE
13 years 11 months ago
2005
IEEE
Abstract— We present a specification language and algorithms for the online and offline monitoring of synchronous systems including circuits and embedded systems. Such monitori...