6 search results - page 1 / 2 » Diagnostic and Detection Fault Collapsing for Multiple Outpu... |
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
We discuss fault equivalence and dominance relations for multiple output combinational circuits. The conventional definition for equivalence says that “Two faults are equivalen...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
IOLTS
2009
IEEE
13 years 11 months ago
2009
IEEE
—Robust circuit design has become a major concern for nanoscale technologies. As a consequence, for design validation, not only the functionality of a circuit has to be considere...
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
— This paper describes a new self-testing 1-bit full adder. This circuit consists of three polymorphic NAND/NOR gates, two XOR gates and two inverters. The adder is able to detec...
ITC
1993
IEEE
13 years 9 months ago
1993
IEEE
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...