ITC 1993 International Test Conference
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Wall of Fame | Most Viewed ITC-1993 Paper
ITC
1993
IEEE
13 years 8 months ago
1993
IEEE
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
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| Id | Read | Views | Title | Status |
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| 1 |  | 148 | ||
| 2 | | 110 | ||
| 3 | | 104 | ||
| 4 | | 95 | ||
| 5 | | 85 | ||
| 6 | | 69 |