We discuss fault equivalence and dominance relations for multiple output combinational circuits. The conventional definition for equivalence says that “Two faults are equivalen...
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
—Robust circuit design has become a major concern for nanoscale technologies. As a consequence, for design validation, not only the functionality of a circuit has to be considere...
Marc Hunger, Sybille Hellebrand, Alejandro Czutro,...
— This paper describes a new self-testing 1-bit full adder. This circuit consists of three polymorphic NAND/NOR gates, two XOR gates and two inverters. The adder is able to detec...
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...
Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A...