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ITCC
2005
IEEE
13 years 10 months ago
2005
IEEE
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
ICMCS
2006
IEEE
13 years 10 months ago
2006
IEEE
With increased concern for physical security, video surveillance is becoming an important business area. Similar camera-based system can also be used in such diverse applications ...