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» Digital Processing of Scanned Negatives
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ICCAD
2009
IEEE
135views Hardware» more  ICCAD 2009»
13 years 3 months ago
Enhanced reliability-aware power management through shared recovery technique
While Dynamic Voltage Scaling (DVS) remains as a popular energy management technique for real-time embedded applications, recent research has identified significant and negative i...
Baoxian Zhao, Hakan Aydin, Dakai Zhu
PROMISE
2010
13 years 15 days ago
Exploiting count spectra for Bayesian fault localization
Background: Automated diagnosis of software defects can drastically increase debugging efficiency, improving reliability and time-to-market. Current, low-cost, automatic fault dia...
Rui Abreu, Alberto González-Sanchez, Arjan ...
ISCA
2011
IEEE
333views Hardware» more  ISCA 2011»
12 years 9 months ago
The impact of memory subsystem resource sharing on datacenter applications
In this paper we study the impact of sharing memory resources on five Google datacenter applications: a web search engine, bigtable, content analyzer, image stitching, and protoc...
Lingjia Tang, Jason Mars, Neil Vachharajani, Rober...
ICDT
2012
ACM
251views Database» more  ICDT 2012»
11 years 8 months ago
Computing universal models under guarded TGDs
A universal model of a database D and a set Σ of integrity constraints is a database that extends D, satisfies Σ, and is most general in the sense that it contains sound and co...
André Hernich