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DAC
2008
ACM
14 years 6 months ago
ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction
In this paper, we present ELIAD, an efficient lithography aware detailed router to optimize silicon image after optical proximity correction (OPC) in a correct-by-construction man...
Minsik Cho, Kun Yuan, Yongchan Ban, David Z. Pan
ICPR
2008
IEEE
14 years 6 months ago
Multiple kernel learning from sets of partially matching image features
Abstract: Kernel classifiers based on Support Vector Machines (SVM) have achieved state-ofthe-art results in several visual classification tasks, however, recent publications and d...
Guo ShengYang, Min Tan, Si-Yao Fu, Zeng-Guang Hou,...