The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review in...
Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, ...
: This paper presents three variants of Genetic Programming (GP) approaches for intelligent online performance monitoring of electronic circuits and systems. Reliability modeling o...
This paper presents two variants of Genetic Programming (GP) approaches for intelligent online performance monitoring of electronic circuits and systems. Reliability modeling of el...
In this paper, a new method for evolving simple electronic circuits is discussed, with the aim of improving the reliability and performance of basic circuit blocks. Next-generatio...
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael ...