34 search results - page 2 / 7 » Elimination of Crucial Faults by a New Selective Testing Met... |
ICECCS
2002
IEEE
13 years 10 months ago
2002
IEEE
Although program faults are widely studied, there are many aspects of faults that we still do not understand, particularly about OO software. In addition to the simple fact that o...
BMCBI
2007
13 years 5 months ago
2007
Background: Classification studies using gene expression datasets are usually based on small numbers of samples and tens of thousands of genes. The selection of those genes that a...
TCAD
2008
13 years 5 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
3DPVT
2004
IEEE
13 years 9 months ago
2004
IEEE
We present a novel range sensing method that is capable of constructing accurate 3D models of specular objects. Our method utilizes a new range imaging concept called multi-peak r...
CDC
2008
IEEE
13 years 7 months ago
2008
IEEE
Abstract-- Detecting and isolating multiple faults is a computationally intense task which typically consists of computing a set of tests, and then computing the diagnoses based on...