13 search results - page 3 / 3 » Emerging Yield and Reliability Challenges in Nanometer CMOS ... |
ICCAD
2008
IEEE
14 years 2 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
TVLSI
2002
13 years 4 months ago
2002
Abstract--This paper provides a high level survey of the increasing effects of on-chip inductance. These effects are classified into desirable and nondesirable effects. Among the u...
MICRO
2009
IEEE
13 years 12 months ago
2009
IEEE
With continued advances in CMOS technology, parameter variations are emerging as a major design challenge. Irregularities during the fabrication of a microprocessor and variations...