15 search results - page 2 / 3 » Emulation-based Fault Injection in Circuits with Embedded Me... |
CHES
2010
Springer
13 years 6 months ago
2010
Springer
This paper introduces a new class of optical fault injection attacks called bumping attacks. These attacks are aimed at data extraction from secure embedded memory, which usually s...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Device scaling in new and future technologies brings along severe increase in the soft error rate of circuits, for combinational and sequential logic. Although potential solutions...
DSN
2000
IEEE
13 years 9 months ago
2000
IEEE
In order to be able to tolerate the effects of faults, we must first detect the symptoms of faults, i.e. the errors. This paper evaluates the error detection properties of an erro...
ATS
2010
IEEE
13 years 2 months ago
2010
IEEE
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...