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DAC
2006
ACM
13 years 10 months ago
Visibility enhancement for silicon debug
Several emerging Design-for-Debug (DFD) methodologies are addressing silicon debug by making internal signal values and other data observable. Most of these methodologies require ...
Yu-Chin Hsu, Fur-Shing Tsai, Wells Jong, Ying-Tsai...
ASPDAC
2008
ACM
168views Hardware» more  ASPDAC 2008»
13 years 6 months ago
A fast two-pass HDL simulation with on-demand dump
- Simulation-based functional verification is characterized by two inherently conflicting targets: the signal visibility and simulation performance. Achieving a proper trade-off be...
Kyuho Shim, Youngrae Cho, Namdo Kim, Hyuncheol Bai...
ICIP
2006
IEEE
14 years 6 months ago
Fusion of Visible and Infrared Images using Empirical Mode Decomposition to Improve Face Recognition
In this effort, we propose a new image fusion technique, utilizing Empirical Mode Decomposition (EMD), for improved face recognition. EMD is a non-parametric datadriven analysis t...
Harishwaran Hariharan, Andreas Koschan, Besma R. A...
IJCNN
2006
IEEE
13 years 10 months ago
Off-line Signature Verification using the Enhanced Modified Direction Feature and Neural-based Classification
—Signatures continue to be an important biometric for authenticating the identity of human beings. This paper presents an effective method to perform off-line signature verificat...
Stephane Armand, Michael Blumenstein, Vallipuram M...