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    ICCAD
    2000
    IEEE
    97views Hardware» more  ICCAD 2000»
    Error Catch and Analysis for Semiconductor Memories Using March Tests
    13 years 9 months ago
    Error Catch and Analysis for Semiconductor Memories Using March Tests
    Download  www.cecs.uci.edu
    We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
    Chi-Feng Wu, Chih-Tsun Huang, Chih-Wea Wang, Kuo-L...
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    IOLTS
    2008
    IEEE
    117views Hardware» more  IOLTS 2008»
    Verification and Analysis of Self-Checking Properties through ATPG
    13 years 11 months ago
    Verification and Analysis of Self-Checking Properties through ATPG
    Download  www.date.uni-paderborn.de
    Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
    Marc Hunger, Sybille Hellebrand
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