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    ICCAD
    2000
    IEEE
    97views Hardware» more  ICCAD 2000»
    Error Catch and Analysis for Semiconductor Memories Using March Tests
    13 years 10 months ago
    Error Catch and Analysis for Semiconductor Memories Using March Tests
    Download  www.cecs.uci.edu
    We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
    Chi-Feng Wu, Chih-Tsun Huang, Chih-Wea Wang, Kuo-L...
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    IOLTS
    2008
    IEEE
    117views Hardware» more  IOLTS 2008»
    Verification and Analysis of Self-Checking Properties through ATPG
    14 years 5 days ago
    Verification and Analysis of Self-Checking Properties through ATPG
    Download  www.date.uni-paderborn.de
    Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
    Marc Hunger, Sybille Hellebrand
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