72 search results - page 3 / 15 » Estimation and optimization of reliability of noisy digital ... |
ICCAD
1997
IEEE
13 years 10 months ago
1997
IEEE
Maximum instantaneous power in VLSI circuits has a great impact on circuit's reliability and the design of power and ground lines. To synthesizehighlyreliablesystems,accurate...
ICTAI
2009
IEEE
13 years 3 months ago
2009
IEEE
This paper describes a noise-aware dominance operator for evolutionary algorithms to solve the multiobjective optimization problems (MOPs) that contain noise in their objective fu...
DSD
2008
IEEE
14 years 14 days ago
2008
IEEE
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...
IASTEDCCS
2004
13 years 7 months ago
2004
Unlike the classical deterministic digital circuit analysis, we consider the analysis of uncertain digital circuits defined as follows. Given a binary function of n uncertain inpu...
DAC
2009
ACM
14 years 24 days ago
2009
ACM
Multicore SOCs rely on runtime thermal measurements using on-chip sensors for DTM. In this paper we address the problem of estimating the actual temperature of on-chip thermal sen...