7 search results - page 2 / 2 » Experimental Results for IDDQ and VLV Testing |
ICCAD
2009
IEEE
13 years 3 months ago
2009
IEEE
-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...
ATS
2009
IEEE
14 years 27 days ago
2009
IEEE
—Measuring the steady state leakage current (IDDQ) is very successful in detecting faults not discovered by standard fault models. But vector dependencies of IDDQ decrease the re...