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CCECE
2009
IEEE
13 years 9 months ago
Experimental validation of statistical algorithm for diagnosis of damage fault
A statistical algorithm was developed for the damage fault diagnosis and prognosis tool and the present work focuses on the experimental validation. The oxide scale growth experim...
Amar Kumar, Amiya Nayak, Alka Srivastava, Nita Goe...
DATE
2003
IEEE
120views Hardware» more  DATE 2003»
13 years 10 months ago
Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...
Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-...
ITC
2003
IEEE
126views Hardware» more  ITC 2003»
13 years 10 months ago
Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies
This paper describes a new post-silicon validation problem for diagnosing systematic timing errors. We illustrate the differences between timing validation and the traditional log...
Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M....
ITC
2003
IEEE
153views Hardware» more  ITC 2003»
13 years 10 months ago
An Efficient and Effective Methodology on the Multiple Fault Diagnosis
In this paper, we analyze failing circuits and propose a multiple-fault diagnosis approach. Our methodology has been validated experimentally and has proved to be highly efficient...
Zhiyuan Wang, Kun-Han Tsai, Malgorzata Marek-Sadow...
TSE
2010
151views more  TSE 2010»
13 years 3 months ago
The Probabilistic Program Dependence Graph and Its Application to Fault Diagnosis
This paper presents an innovative model of a program’s internal behavior over a set of test inputs, called the probabilistic program dependence graph (PPDG), that facilitates pr...
George K. Baah, Andy Podgurski, Mary Jean Harrold