2 search results - page 1 / 1 » FPGA Defect Tolerance: Impact of Granularity |
FPT
2005
IEEE
13 years 10 months ago
2005
IEEE
As device sizes shrink, FPGAs are increasingly prone to manufacturing defects. The ability to tolerate multiple defects is anticipated to be very important at 45nm and beyond. One...
FPL
2005
Springer
13 years 10 months ago
2005
Springer
Future process nodes have such small feature sizes that there will be an increase in the number of manufacturing defects per die. For large FPGAs, it will be critical to tolerate ...