25 search results - page 2 / 5 » Failure analysis of timing and IDDq-only failures from the S... |
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
An in-circuit diagnostic test structure triggered by a light pulse captures logic states on-chip with picosecond timing accuracy, and the results read out via a scan chain thus pr...
ITC
1998
IEEE
13 years 10 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
KDD
2000
ACM
13 years 9 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
KBSE
2009
IEEE
14 years 21 days ago
2009
IEEE
—Developers often change software in ways that cause tests to fail. When this occurs, developers must determine whether failures are caused by errors in the code under test or in...
FAST
2011
12 years 9 months ago
2011
We present Anticipatory Memory Allocation (AMA), a new method to build kernel code that is robust to memoryallocation failures. AMA avoids the usual difficulties in handling allo...