This paper presents an extension of Bayesian networks (BN) applied to reliability analysis. We developed a general methodology for modelling reliability of complex systems based o...
A novel method (the V-shaped curve) is presented to predict the failure probability of anisotropic conductive film (ACF) in IC/substrate assemblies. The Poisson function is used t...
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...
—The methodologies to calculate failure probability and to estimate the reliability of fatigue loaded structures are developed. The applicability of the methodologies is evaluate...
The presented fault model uniquely describes all structural changes in the transistor net list that can be caused by spot defects, including faults that connect more than two nets...