42 search results - page 9 / 9 » Fault Detection Capabilities of Coupling-based OO Testing |
ASPLOS
2010
ACM
14 years 5 days ago
2010
ACM
We present a general scheme for virtualizing main memory errorcorrection mechanisms, which map redundant information needed to correct errors into the memory namespace itself. We ...
DAC
2007
ACM
14 years 6 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...