102 search results - page 2 / 21 » Fault Detection Likelihood of Test Sequence Length |
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
ICST
2008
IEEE
13 years 11 months ago
2008
IEEE
Software-testing researchers have long sought recipes for test suites that detect faults well. In the literature, empirical studies of testing techniques abound, yet the ideal tec...
TIT
2008
13 years 4 months ago
2008
Abstract--This letter considers the average complexity of maximum-likelihood (ML) decoding of convolutional codes. ML decoding can be modeled as finding the most probable path take...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
A method to select the lengths of functional sequences in a BIST scheme for scan designs is proposed in this paper. A functional sequence is a sequence of primary input vectors ap...
ATS
2000
IEEE
13 years 9 months ago
2000
IEEE
: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed i...