87 search results - page 18 / 18 » Fault Diagnosis Using Timed Automata |
CONSTRAINTS
2007
13 years 5 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
ISCA
2009
IEEE
14 years 7 days ago
2009
IEEE
Detecting data races in parallel programs is important for both software development and production-run diagnosis. Recently, there have been several proposals for hardware-assiste...